Invention Grant
- Patent Title: TWA measuring apparatus and TWA measuring method
- Patent Title (中): TWA测量仪器和TWA测量方法
-
Application No.: US14149968Application Date: 2014-01-08
-
Publication No.: US09198594B2Publication Date: 2015-12-01
- Inventor: Tsuneo Takayanagi , Takashi Kaiami
- Applicant: NIHON KOHDEN CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIHON KOHDEN CORPORATION
- Current Assignee: NIHON KOHDEN CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-002859 20130110
- Main IPC: A61B5/0452
- IPC: A61B5/0452 ; A61B5/0472

Abstract:
A TWA measuring apparatus includes: a T-wave feature quantity measuring section; a classifying section classifying T-wave feature quantities into groups of odd and even electrocardiogram waveforms; a reliability index calculating section calculating: first and second representative values and first and second dispersion values of the T-wave feature quantities in the odd and even group; a difference between the first and second representative values, to obtain a TWA feature quantity; and an adjustment value between the first representative value and the first dispersion value, and an adjustment value between the second representative value and the second dispersion value, to obtain a reliability index; and a reliability recognizing section recognizing: when the reliability index exceeds a threshold, that reliability of the TWA feature quantity is high; and when the reliability index does not exceed the threshold, that the reliability is low.
Public/Granted literature
- US20140194764A1 TWA MEASURING APPARATUS AND TWA MEASURING METHOD Public/Granted day:2014-07-10
Information query