Invention Grant
US09199860B2 Apparatus and method for nonlinear process identification using orthonormal bases and ordinal splines in a process control system
有权
在过程控制系统中使用正交基数和顺序样条的非线性过程识别的装置和方法
- Patent Title: Apparatus and method for nonlinear process identification using orthonormal bases and ordinal splines in a process control system
- Patent Title (中): 在过程控制系统中使用正交基数和顺序样条的非线性过程识别的装置和方法
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Application No.: US13324215Application Date: 2011-12-13
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Publication No.: US09199860B2Publication Date: 2015-12-01
- Inventor: J. Ward MacArthur
- Applicant: J. Ward MacArthur
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Main IPC: G06F19/00
- IPC: G06F19/00 ; C02F1/00 ; G05B13/04

Abstract:
A method includes receiving data associated with operation of an industrial process system. The method also includes identifying a model defining a behavior of the industrial process system using the data, an orthonormal bases function, and an ordinal spline bases function. The orthonormal bases function can be generated using estimated poles of the industrial process system. The ordinal spline bases function can be generated using a specified set of cubic splines. The ordinal spline bases function can also be generated using a distribution of knots and multiple ordinal spline functions associated with the knots. More knots can be associated with a more nonlinear portion of the industrial process system, and fewer knots can be associated with a less nonlinear portion or a linear portion of the industrial process system.
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