Methods and apparatuses for determining surface wetting of a metallic material with changing well fluids. In general, the methods according to the invention include measuring electrical impedance spectroscopy (“EIS”) for a system simulating downhole conditions for the wetting of a surface. Methods and apparatuses for making EIS measurements model double-layer capacitance at a downhole surface in a well, from which the nature and quantification of the wetting of the surface can be inferred.