Invention Grant
- Patent Title: Measurement and testing system
- Patent Title (中): 测量和测试系统
-
Application No.: US14556656Application Date: 2014-12-01
-
Publication No.: US09200897B1Publication Date: 2015-12-01
- Inventor: Todd Christopher Wilson , Necip Berme
- Applicant: Bertec Corporation
- Applicant Address: US OH Columbus
- Assignee: Bertec Corporation
- Current Assignee: Bertec Corporation
- Current Assignee Address: US OH Columbus
- Agency: The Law Office of Patrick F. O'Reilly III, LLC
- Main IPC: G01N33/50
- IPC: G01N33/50 ; G01B21/00 ; G01L1/00

Abstract:
A measurement and testing system comprising a plurality of measurement assemblies and a data acquisition and processing device is disclosed. Each of the plurality of measurement assemblies includes a measurement surface for receiving at least one portion of a body of a subject; and at least one measurement device configured to sense one or more measured quantities and output one or more signals that are representative of the one or more measured quantities. In one embodiment, the data acquisition and processing device is configured to determine whether a load is being applied to a particular one of the plurality of measurement assemblies by a first or second body portion of the subject. In another embodiment, the data acquisition and processing device is configured to construct a first virtual measurement assembly from a first subset of measurement assemblies and a second virtual measurement assembly from a second subset of measurement assemblies.
Information query
IPC分类: