Invention Grant
US09202517B1 Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks
有权
基于针对参考轨迹测量的统计质量度量,磁盘驱动器校准缺陷阈值
- Patent Title: Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks
- Patent Title (中): 基于针对参考轨迹测量的统计质量度量,磁盘驱动器校准缺陷阈值
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Application No.: US13762850Application Date: 2013-02-08
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Publication No.: US09202517B1Publication Date: 2015-12-01
- Inventor: Carl E. Barlow , Chirag C. Patel , Andrew W. Fok , Chun Sei Tsai , Donald Brunnett
- Applicant: Western Digital Technologies, Inc.
- Applicant Address: US CA Irvine
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Irvine
- Main IPC: G11B20/18
- IPC: G11B20/18

Abstract:
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. First data is written to a first data track, and the first data is read from the first data track to measure a first quality metric representing a recording quality of the first data. Second data is written to a second data track, and the second data is read from the second data track to measure a second quality metric representing a recording quality of the second data. The first and second quality metrics are processed to generate a first statistical quality metric. A first defect threshold is generated based on the first statistical quality metric, and at least part of the disk is scanned for defects based on the first defect threshold.
Public/Granted literature
- US2621443A Walking doll Public/Granted day:1952-12-16
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