Invention Grant
US09202517B1 Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks 有权
基于针对参考轨迹测量的统计质量度量,磁盘驱动器校准缺陷阈值

Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks
Abstract:
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. First data is written to a first data track, and the first data is read from the first data track to measure a first quality metric representing a recording quality of the first data. Second data is written to a second data track, and the second data is read from the second data track to measure a second quality metric representing a recording quality of the second data. The first and second quality metrics are processed to generate a first statistical quality metric. A first defect threshold is generated based on the first statistical quality metric, and at least part of the disk is scanned for defects based on the first defect threshold.
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