Invention Grant
- Patent Title: Delay quantity estimation apparatus and delay quantity estimation method
- Patent Title (中): 延迟量估计装置和延迟量估计方法
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Application No.: US14039598Application Date: 2013-09-27
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Publication No.: US09203449B2Publication Date: 2015-12-01
- Inventor: Satoshi Matsubara , Hideharu Shako , Mitsuharu Hamano , Kazuo Nagatani
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2012-261727 20121129
- Main IPC: H03D1/00
- IPC: H03D1/00 ; H04B1/04

Abstract:
A delay quantity estimation apparatus comprises a first correlation value arithmetic unit to calculate a first correlation value as a correlation value between a first input signal and a feedback signal delayed with a first delay value; a second correlation value arithmetic unit to calculate a second correlation value as a correlation value between the first input signal and a feedback signal delayed with a second delay value; and a delay quantity estimation unit to estimate a delay quantity of the feedback signal with respect to the input signal on the basis of the first difference value as a difference between the first correlation value and the second correlation value, wherein the second delay value is a value given by adding a certain value to the first delay value.
Public/Granted literature
- US20140146910A1 DELAY QUANTITY ESTIMATION APPARATUS AND DELAY QUANTITY ESTIMATION METHOD Public/Granted day:2014-05-29
Information query
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