Invention Grant
US09207260B2 Probe block, probe card and probe apparatus both having the probe block
有权
探头块，探针卡和探针装置均具有探针块
- Patent Title: Probe block, probe card and probe apparatus both having the probe block
- Patent Title (中): 探头块，探针卡和探针装置均具有探针块
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Application No.: US13671040Application Date: 2012-11-07
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Publication No.: US09207260B2Publication Date: 2015-12-08
- Inventor: Takashi Ogasawara , Norie Yamaguchi
- Applicant: KABUSHIKI KAISHA NIHON MICRONICS
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee Address: JP Tokyo
- Agency: Browdy and Neimark, PLLC
- Priority: JP2011-243826 20111107
- Main IPC: G01R1/067
- IPC: G01R1/067
Abstract:
The present invention provides a probe block, which comprises 1) a conductive base on which a first groove is formed, 2) a pair of signal transmitting probes which have dielectric covers and are placed parallel to each other in the first groove, and 3) a ground probe which is in contact with the conductive base, wherein front portions of the signal transmitting probes and the ground probe protrude from the conductive base to form signal transmitting probe needles and a ground probe needle, respectively. The probe block of the present invention has excellent high frequency responses characteristics and is easy for maintenance.
Public/Granted literature
- US20130113512A1 PROBE BLOCK, PROBE CARD AND PROBE APPARATUS BOTH HAVING THE PROBE BLOCK Public/Granted day:2013-05-09
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