Invention Grant
US09213617B2 Error response circuit, semiconductor integrated circuit, and data transfer control method
有权
误差响应电路,半导体集成电路和数据传输控制方法
- Patent Title: Error response circuit, semiconductor integrated circuit, and data transfer control method
- Patent Title (中): 误差响应电路,半导体集成电路和数据传输控制方法
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Application No.: US13785123Application Date: 2013-03-05
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Publication No.: US09213617B2Publication Date: 2015-12-15
- Inventor: Natsumi Saito , Eiichi Nimoda
- Applicant: FUJITSU SEMICONDUCTOR LIMITED
- Applicant Address: JP Yokohama
- Assignee: SOCIONEXT INC.
- Current Assignee: SOCIONEXT INC.
- Current Assignee Address: JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2012-072059 20120327
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G06F11/07

Abstract:
In an error response circuit an analysis circuit unit analyzes a command transmitted from a first circuit section to a second circuit section, and detects a status of data transfer between the first circuit section and the second circuit section. A response circuit unit generates an error signal in accordance with the detected status of the data transfer in response to the second circuit section changing from a first power consumption state to a second power consumption state in which power consumption is lower than power consumption in the first power consumption state. A switching circuit unit transmits the error signal to the first circuit section in place of a response signal that is responsive to the command and transmitted from the second circuit section to the first circuit section.
Public/Granted literature
- US20130262939A1 ERROR RESPONSE CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, AND DATA TRANSFER CONTROL METHOD Public/Granted day:2013-10-03
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