The present invention provides a secondary cell, wherein an area having generated therein a phenomenon due to an internal short-circuit can be freely changed, a change in the secondary cell due to the generation of the internal short-circuit is correctly grasped, and safety of the secondary cell can be accurately evaluated when the internal short-circuit is generated. An internal short-circuit test method for the secondary cell is also provided. In the present invention, the secondary cell is configured by disposing: an electrode group, which is formed by winding or laminating a positive electrode plate, a negative electrode plate, and an insulating layer disposed between the positive electrode plate and the negative electrode plate; and a heat generating body, which is disposed between the positive electrode plate and the insulating layer or between the negative electrode plate and the insulating layer.