Invention Grant
US09217999B2 Systems and methods for analyzing data in a non-destructive testing system
有权
用于在非破坏性测试系统中分析数据的系统和方法
- Patent Title: Systems and methods for analyzing data in a non-destructive testing system
- Patent Title (中): 用于在非破坏性测试系统中分析数据的系统和方法
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Application No.: US13747449Application Date: 2013-01-22
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Publication No.: US09217999B2Publication Date: 2015-12-22
- Inventor: Michael Christopher Domke , Jason Howard Messinger , Sekhar Soorianarayanan , Thomas Eldred Lambdin , Scott Leo Sbihli
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G05B23/00

Abstract:
A collaboration system may include a non-destructive testing (NDT) inspection device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple a plurality of computing devices and the NDT inspection device may acquire inspection data, establish a communication connection to the at least one other computing device, and send the data to the at least one other computing device. There, the at least one other computing device may analyze the data. After the data is analyzed, the NDT inspection device may receive the analyzed data from the at least one other computing device.
Public/Granted literature
- US20140208163A1 SYSTEMS AND METHODS FOR ANALYZING DATA IN A NON-DESTRUCTIVE TESTING SYSTEM Public/Granted day:2014-07-24
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