Invention Grant
- Patent Title: Eyelash measuring device
- Patent Title (中): 睫毛测量装置
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Application No.: US14166484Application Date: 2014-01-28
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Publication No.: US09226537B1Publication Date: 2016-01-05
- Inventor: Yongho Han
- Applicant: Yongho Han
- Agent Richard L Miller
- Main IPC: A61B1/00
- IPC: A61B1/00 ; A61B5/103 ; A61B5/117 ; G01B1/00 ; A41G5/02 ; A61B5/107

Abstract:
An eyelash measuring device having: a ruler, a substantially eye shaped opening formed by an upper arch and a lower arch, and a graticule. The ruler is on the upper arch of the substantially eye-shaped opening and allows a user to measure an eyelash, and then set the measurement via the graticule. The eye shaped opening allows a user to gaze through the device to a mirror for measuring, and the ruler is printed in reverse so that when gazing in a mirror the type appears to be correctly oriented.
Information query