Invention Grant
- Patent Title: Apparatus and method for chemical mechanical polishing
- Patent Title (中): 化学机械抛光的设备和方法
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Application No.: US14145192Application Date: 2013-12-31
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Publication No.: US09227294B2Publication Date: 2016-01-05
- Inventor: Chung-Liang Cheng , Yen-Yu Chen , Chang-Sheng Lee , Wei Zhang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agent Chun-Ming Shih
- Main IPC: B24B37/00
- IPC: B24B37/00 ; B24B37/013 ; B24B49/10 ; B24B37/20

Abstract:
An apparatus for chemical mechanical polishing includes a wafer carrier, a first electrode, a rotatable pedestal, a second electrode, and an electric current detector. The first electrode is disposed at the wafer carrier. The rotatable pedestal is positioned opposite to the wafer carrier in order to perform a polishing operation with the wafer carrier accordingly. The second electrode is disposed at the rotatable pedestal and electrically coupled to the first electrode in order to form a circuit loop. The electric current detector is between the first electrode and the second electrode.
Public/Granted literature
- US20150183080A1 APPARATUS AND METHOD FOR CHEMICAL MECHANICAL POLISHING Public/Granted day:2015-07-02
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