Invention Grant
US09228865B2 Multi-analyzer and multi-reference sample validation system and method
有权
多分析仪和多参考样本验证系统及方法
- Patent Title: Multi-analyzer and multi-reference sample validation system and method
- Patent Title (中): 多分析仪和多参考样本验证系统及方法
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Application No.: US13868994Application Date: 2013-04-23
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Publication No.: US09228865B2Publication Date: 2016-01-05
- Inventor: Michael Paul Andraos
- Applicant: Xenon, Inc.
- Applicant Address: US CA Irvine
- Assignee: XENON, INC.
- Current Assignee: XENON, INC.
- Current Assignee Address: US CA Irvine
- Agency: Sheridan Ross P.C.
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01D18/00 ; G01N33/28 ; G01N35/00

Abstract:
Validation systems and methods are described. Specifically, the disclosed validation system has the ability to simultaneously or sequentially analyze the Reid Vapor Pressure (RVP) or any other property of process samples taken from the same or different sources. The validation system is scalable to validate with multiple reference samples to one or multiple analyzers. The system is also scalable to operate multiple streams of a single or multiple fuels to multiple analyzers.
Public/Granted literature
- US20130276507A1 MULTI-REFERENCE SAMPLE VALIDATION SYSTEM AND METHOD Public/Granted day:2013-10-24
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