Invention Grant
- Patent Title: RTD measurement device
- Patent Title (中): RTD测量装置
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Application No.: US13590395Application Date: 2012-08-21
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Publication No.: US09228905B2Publication Date: 2016-01-05
- Inventor: Daniel Milton Alley
- Applicant: Daniel Milton Alley
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Hoffman Warnick LLC
- Agent Ernest G. Cusick
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K7/00 ; G01K7/20

Abstract:
Aspects of the invention provide for a resistance temperature device (RTD) measurement device. In one embodiment, aspects of the invention include a RTD measurement device that includes: an input including a plurality of terminals from an RTD sensor; a plurality of burnout switches, each burnout switch connected to a terminal of the RTD sensor; a plurality of resources; and a switch block connecting the plurality of terminals and the plurality of resources to determine a measurement of the RTD sensor.
Public/Granted literature
- US20140056329A1 RTD MEASUREMENT DEVICE Public/Granted day:2014-02-27
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