Invention Grant
US09228906B2 Quartz-temperature-measurement probe and quartz-temperature-measurement device 有权
石英温度测量探头和石英温度测量装置

  • Patent Title: Quartz-temperature-measurement probe and quartz-temperature-measurement device
  • Patent Title (中): 石英温度测量探头和石英温度测量装置
  • Application No.: US14376780
    Application Date: 2013-09-02
  • Publication No.: US09228906B2
    Publication Date: 2016-01-05
  • Inventor: Masato Tanabe
  • Applicant: Masato Tanabe
  • Applicant Address: JP Yokohama
  • Assignee: Masato Tanabe
  • Current Assignee: Masato Tanabe
  • Current Assignee Address: JP Yokohama
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2012-208183 20120921
  • International Application: PCT/JP2013/073478 WO 20130902
  • International Announcement: WO2014/045848 WO 20140327
  • Main IPC: G01K7/32
  • IPC: G01K7/32 G01K7/24
Quartz-temperature-measurement probe and quartz-temperature-measurement device
Abstract:
A crystal oscillator (31) (Y-cut) has a temperature characteristic in which its oscillating frequency significantly changes with temperature, whereas a crystal oscillator (32) (AT-cut) has a temperature characteristic in which its oscillating frequency is stable with temperature. Crystal oscillators (31, 32) are cut from a raw material of the same type and configured to be substantially equal in shape, material, and size, and provide a combination of oscillation frequencies such that the frequency of a signal generated by a differential frequency circuit (35) will be less than or equal to 10 kHz within a measuring temperature range of 21 to 30° C. The frequency of a signal generated by differential frequency generating circuit (35) is output to a measurement apparatus main unit and a frequency counting circuit (15) measures the frequency of this signal by a reciprocal counting method to obtain at least eight or more significant digits.
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