Invention Grant
- Patent Title: Flexible device deformation measurement
- Patent Title (中): 灵活的设备变形测量
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Application No.: US14080376Application Date: 2013-11-14
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Publication No.: US09228907B2Publication Date: 2016-01-05
- Inventor: Antti Salo , Matti Kosonen
- Applicant: Nokia Corporation
- Applicant Address: FI Espoo
- Assignee: Nokia Technologies Oy
- Current Assignee: Nokia Technologies Oy
- Current Assignee Address: FI Espoo
- Agency: Locke Lord LLP
- Main IPC: G01L1/04
- IPC: G01L1/04 ; G01L1/14 ; G01L1/12 ; G06F3/0487 ; G06F1/16 ; G06F3/01 ; G06F3/041 ; H04M1/02 ; G01B7/16
Abstract:
Monitoring deformation of a flexible electronic apparatus. Changes in space within the apparatus between at least two measurement points are detected; and degree of deformation of the apparatus is determined based on the detected changes in the space within the apparatus between the at least two measurement points.
Public/Granted literature
- US20150128728A1 FLEXIBLE DEVICE DEFORMATION MEASUREMENT Public/Granted day:2015-05-14
Information query
