Invention Grant
- Patent Title: Sample analysis element and detection device
- Patent Title (中): 样品分析元件和检测装置
-
Application No.: US14395243Application Date: 2013-04-12
-
Publication No.: US09228944B2Publication Date: 2016-01-05
- Inventor: Mamoru Sugimoto , Jun Amako , Hideaki Nishida
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2012-094519 20120418
- International Application: PCT/JP2013/002503 WO 20130412
- International Announcement: WO2013/157233 WO 20131024
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/552 ; G01N21/65

Abstract:
There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.
Public/Granted literature
- US20150103347A1 SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE Public/Granted day:2015-04-16
Information query