Invention Grant
- Patent Title: Accuracy management method
- Patent Title (中): 精准管理方法
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Application No.: US13141984Application Date: 2009-11-19
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Publication No.: US09229015B2Publication Date: 2016-01-05
- Inventor: Qing Li , Tomonori Mimura , Shinichi Fukuzono , Naomi Ishii
- Applicant: Qing Li , Tomonori Mimura , Shinichi Fukuzono , Naomi Ishii
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge PC
- Priority: JP2008-331830 20081226
- International Application: PCT/JP2009/006209 WO 20091119
- International Announcement: WO2010/073479 WO 20100701
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01D18/00 ; G01N35/02

Abstract:
There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.
Public/Granted literature
- US20120000268A1 ACCURACY MANAGEMENT METHOD Public/Granted day:2012-01-05
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