Invention Grant
- Patent Title: Sample analyzer and sample analyzing method
- Patent Title (中): 样品分析仪和样品分析方法
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Application No.: US13315884Application Date: 2011-12-09
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Publication No.: US09229018B2Publication Date: 2016-01-05
- Inventor: Hiroto Toyoshima , Kazunori Mototsu
- Applicant: Hiroto Toyoshima , Kazunori Mototsu
- Applicant Address: JP Kobe-Shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-Shi
- Agency: Brinks Gilson & Lione
- Priority: JPJP2010-278440 20101214
- Main IPC: G01N1/18
- IPC: G01N1/18 ; G01N35/00 ; G01N35/10

Abstract:
The present invention is to present a sample analyzer for analyzing a target substance in a sample by carrying out a target substance separating process for separating a complex containing the target substance and a magnetic particle from other substances other than the complex. The sample analyzer executes the target substance separating process with respect to a second container held by a second holder with a second nozzle while executing the target substance separating process with respect to a first container held by a first holder with a first nozzle, and completes the target substance separating process with respect to the first container with the first nozzle and completes the target substance separating process with respect to the second container with the second nozzle.
Public/Granted literature
- US20120149127A1 SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD Public/Granted day:2012-06-14
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