Invention Grant
- Patent Title: Automatic analyzer and sample-processing system
- Patent Title (中): 自动分析仪和样品处理系统
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Application No.: US13560114Application Date: 2012-07-27
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Publication No.: US09229019B2Publication Date: 2016-01-05
- Inventor: Hitoshi Tokieda , Yoshimitsu Takagi , Takeshi Shibuya , Masashi Akutsu
- Applicant: Hitoshi Tokieda , Yoshimitsu Takagi , Takeshi Shibuya , Masashi Akutsu
- Applicant Address: JP Tokyo
- Assignee: HITACH HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACH HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2007-331312 20071225
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/02

Abstract:
A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.
Public/Granted literature
- US20120294764A1 AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM Public/Granted day:2012-11-22
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