Invention Grant
- Patent Title: Automatic test system
- Patent Title (中): 自动测试系统
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Application No.: US14167377Application Date: 2014-01-29
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Publication No.: US09229041B2Publication Date: 2016-01-05
- Inventor: Han Wei Wang , Jung Kuang Liu
- Applicant: Cheng Uei Precision Industry Co., Ltd.
- Applicant Address: TW New Taipei
- Assignee: CHENG UEI PRECISION INDUSTRY CO., LTD.
- Current Assignee: CHENG UEI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: WPAT, P.C.
- Agent Anthony King
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/04 ; G01M99/00

Abstract:
An automatic test system includes a mechanical frame, a test device mounted to the mechanical frame for testing the electrical performance and the mechanical performance of the connector, a packing device mounted to the mechanical frame for packing the connector which is completed to be tested, a transmission device mounted to the mechanical frame for transmitting the connector to each workstation of the test device and the packing device, a moving device mounted to the mechanical frame for moving the connector to each workstation of the test device and the packing device corresponding to the transmission device, and a control system electrically connected with and controlling the test device, the packing device, the transmission device and the moving device for completing the transmission, test and packing action of the connector.
Public/Granted literature
- US20150212142A1 AUTOMATIC TEST SYSTEM Public/Granted day:2015-07-30
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