Invention Grant
- Patent Title: In-situ characterization of a solid-state light source
- Patent Title (中): 固态光源的原位表征
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Application No.: US12269561Application Date: 2008-11-12
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Publication No.: US09229045B2Publication Date: 2016-01-05
- Inventor: David K. McElfresh , Dan Vacar , Leoncio D. Lopez , Kenny C. Gross
- Applicant: David K. McElfresh , Dan Vacar , Leoncio D. Lopez , Kenny C. Gross
- Applicant Address: US CA Redwood Shores
- Assignee: ORACLE AMERICA, INC.
- Current Assignee: ORACLE AMERICA, INC.
- Current Assignee Address: US CA Redwood Shores
- Agency: Park, Vaughan, Fleming & Dowler LLP
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R19/00
Abstract:
Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then, the health of the solid-state light source is characterized based on an analysis of the monitored voltage and current.
Public/Granted literature
- US20100121593A1 IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE Public/Granted day:2010-05-13
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