Invention Grant
US09229049B2 Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals
有权
将测试工具与符合标准基座的集成电路设备配置文件相一致的系统和方法
- Patent Title: Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestals
- Patent Title (中): 将测试工具与符合标准基座的集成电路设备配置文件相一致的系统和方法
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Application No.: US13935439Application Date: 2013-07-03
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Publication No.: US09229049B2Publication Date: 2016-01-05
- Inventor: Nasser Barabi , Chee Wah Ho , Joven R. Tienzo , Oksana Kryachek , Elena V. Nazarov
- Applicant: ESSAI, INC.
- Applicant Address: US CA Fremont
- Assignee: Essai, Inc.
- Current Assignee: Essai, Inc.
- Current Assignee Address: US CA Fremont
- Agent Kang S. Lim
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; G01R1/04
Abstract:
A test socket assembly, useful in association with a thermal control unit used to maintain a set point temperature on an IC device under test, has at least one compliant pedestal is configured to facilitate the testing of integrated circuits where the device under test comprises a substrate having multiple IC chips with different heights and testing requirements.
Public/Granted literature
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