Invention Grant
- Patent Title: BIST circuit for phase measurement
- Patent Title (中): 用于相位测量的BIST电路
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Application No.: US13205722Application Date: 2011-08-09
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Publication No.: US09229050B2Publication Date: 2016-01-05
- Inventor: Tsung-Hsien Tsai , Min-Shueh Yuan , Chih-Hsien Chang
- Applicant: Tsung-Hsien Tsai , Min-Shueh Yuan , Chih-Hsien Chang
- Applicant Address: TW Hsin-chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-chu
- Agency: Duane Morris LLP
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/30 ; G01R31/317

Abstract:
A BIST circuit for high speed applications includes a phase difference detection circuit, a period-to-current conversion circuit having an input coupled to an output of the phase difference detection circuit and a current-to-voltage conversion circuit coupled to an output of the period-to-current conversion circuit. The phase difference detection circuit includes first NAND logic for receiving as inputs an input clock signal and a delayed version of an inverted version of the input clock signal; second NAND logic for receiving as inputs the inverted version of the input clock signal and a delayed version of the input clock signal; third NAND logic for receiving as inputs the input clock signal and the delayed version of the input clock signal; and fourth NAND logic for receiving as inputs the inverted version of the input clock signal and a delayed version of the inverted version of the input clock signal.
Public/Granted literature
- US20130038366A1 BIST CIRCUIT FOR PHASE MEASUREMENT Public/Granted day:2013-02-14
Information query
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