Invention Grant
- Patent Title: Radiation analyzer and method for analyzing radiation
- Patent Title (中): 辐射分析仪和辐射分析方法
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Application No.: US13965673Application Date: 2013-08-13
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Publication No.: US09229114B2Publication Date: 2016-01-05
- Inventor: Keiichi Tanaka , Masataka Ohgaki , Akikazu Odawara
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2012-181833 20120820
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01T1/16 ; G01N23/225 ; G01T1/26

Abstract:
A radiation analyzer includes a transition edge sensor for detecting radiation and a cold head that cools the transition edge sensor. A current detecting mechanism detects a current flowing in the transition edge sensor, and a peak analyzing unit measures a peak value based on the current detected by the current detecting mechanism. A first heater is configured to heat the cold head to keep a temperature of the transition edge sensor constant. A sensitivity correction operating unit is configured to correct a sensitivity of the transition edge sensor based on a relation obtained in advance between an output of the first heater and the peak value measured by the peak analyzing unit.
Public/Granted literature
- US20140048717A1 RADIATION ANALYZER AND METHOD FOR ANALYZING RADIATION Public/Granted day:2014-02-20
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