Invention Grant
- Patent Title: Hybrid apparatus and methods for analyzing electromagnetic waves
- Patent Title (中): 用于分析电磁波的混合装置和方法
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Application No.: US13494226Application Date: 2012-06-12
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Publication No.: US09229226B2Publication Date: 2016-01-05
- Inventor: Shin-Wook Yi , Masatomo Nakazato , Tetsunori Wada , Hyun-joo Kim , Young-kwan Park , Jae-sung Shin
- Applicant: Shin-Wook Yi , Masatomo Nakazato , Tetsunori Wada , Hyun-joo Kim , Young-kwan Park , Jae-sung Shin
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2011-0061797 20110624
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06F17/10 ; G02B27/00 ; G06F17/50 ; G02F1/313 ; G02F1/00 ; G02B6/35

Abstract:
Analysis of an electromagnetic wave traveling in an optical device, can be performed quickly and correctly. A structure forming process simulator forms an analysis structure of a physical object to be analyzed. A hybrid optical simulator calculates time-independent data and time-dependent data of an electromagnetic field by dividing the analysis structure into parts, determining whether a metallic or magnetic material is included in each of the divided parts, and selectively applying a Beam Propagation Method (BPM) or a Finite Difference Time Domain (FDTD) method to the divided parts. A storage device stores the time-independent data and the time-dependent data output from the hybrid optical simulator as hybrid electric field data. Related methods are also described.
Public/Granted literature
- US20120330630A1 HYBRID APPARATUS AND METHODS FOR ANALYZING ELECTROMAGNETIC WAVES Public/Granted day:2012-12-27
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