A test device is provided for testing a device under test (DUT) having a control interface compliant with a standard selected from a plurality of standards each supporting a common set of management data input/output (MDIO) and non-MDIO control signals. The test device includes a test interface and an integrated control interface. The integrated control interface adapts to the standard with which the control interface of the DUT complies, so that the integrated control interface directly and fully controls the DUT via at least the common set of MDIO and non-MDIO control signals. The integrated control interface exchanges control signals selected from the common set of MDIO and non-MDIO control signals with the control interface of the DUT to monitor the DUT and thereby obtain status information about the DUT.