Invention Grant
- Patent Title: Array testing method and device
- Patent Title (中): 阵列测试方法和设备
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Application No.: US13570370Application Date: 2012-08-09
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Publication No.: US09230474B2Publication Date: 2016-01-05
- Inventor: Guang hai Jin , Jae-Beom Choi , Kwan-Wook Jung , June-Woo Lee , Seong-Jun Kim
- Applicant: Guang hai Jin , Jae-Beom Choi , Kwan-Wook Jung , June-Woo Lee , Seong-Jun Kim
- Applicant Address: KR Yongin, Gyeonggi-Do
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin, Gyeonggi-Do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2012-0026174 20120314
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G09G3/32 ; G09G3/00 ; G01R31/26
Abstract:
A method for testing an array, by using an array testing device for detecting a voltage distribution formed on an array substrate, includes resetting pixel voltages of a plurality of pixel circuits formed on the array substrate with a predetermined voltage, detecting the voltage distribution of the array substrate, generating a correction value for correcting the voltage distribution of the array substrate, and measuring a threshold voltage of a driving transistor included in the plurality of pixel circuits formed on the array substrate by applying the correction value.
Public/Granted literature
- US20130243304A1 ARRAY TESTING METHOD AND DEVICE Public/Granted day:2013-09-19
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