Invention Grant
- Patent Title: Semiconductor element and solid-state imaging device
- Patent Title (中): 半导体元件和固态成像器件
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Application No.: US13500331Application Date: 2010-10-05
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Publication No.: US09231006B2Publication Date: 2016-01-05
- Inventor: Shoji Kawahito , Tomonari Sawada
- Applicant: Shoji Kawahito , Tomonari Sawada
- Applicant Address: JP Shizuoka-shi
- Assignee: National University Corporation Shizuoka University
- Current Assignee: National University Corporation Shizuoka University
- Current Assignee Address: JP Shizuoka-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-231587 20091005
- International Application: PCT/JP2010/067452 WO 20101005
- International Announcement: WO2011/043339 WO 20110414
- Main IPC: H01L27/148
- IPC: H01L27/148 ; H01L31/102 ; H01L27/146 ; G01S7/481 ; G01S7/486 ; H04N5/359 ; H04N5/3745 ; H04N5/378

Abstract:
A solid-state imaging device includes a semiconductor region of p-type; a buried region of n-type, configured to serve as a photodiode together with the semiconductor region; a extraction region of n-type, configured to extract charges generated by the photodiode from the buried region, having higher impurity concentration than the buried region; a read-out region of n-type, configured to accumulate charges, which are transferred from the buried region having higher impurity concentration than the buried region; and a potential gradient changing mechanism, configured to control a potential of the channel, and to change a potential gradient of a potential profile from the buried region to the read-out region and a potential gradient of a potential profile from the buried region to the extraction region, so as to control the transferring/extraction of charges.
Public/Granted literature
- US20120193743A1 SEMICONDUCTOR ELEMENT AND SOLID-STATE IMAGING DEVICE Public/Granted day:2012-08-02
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