Invention Grant
- Patent Title: Methods of stress balancing in gallium arsenide wafer processing
- Patent Title (中): 砷化镓晶片加工中应力平衡的方法
-
Application No.: US14530533Application Date: 2014-10-31
-
Publication No.: US09231068B2Publication Date: 2016-01-05
- Inventor: Hong Shen
- Applicant: Skyworks Solutions, Inc.
- Applicant Address: US MA Woburn
- Assignee: Skyworks Solutions, Inc.
- Current Assignee: Skyworks Solutions, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Knobbe Martens Olson and Bear LLP
- Main IPC: H01L29/02
- IPC: H01L29/02 ; H01L29/45 ; H01L21/768 ; H01L29/20 ; H01L33/12 ; H01L27/02 ; H01L21/8252 ; H01L23/00

Abstract:
Systems, apparatuses, and methods related to the design, fabrication, and manufacture of gallium arsenide (GaAs) integrated circuits are disclosed. Copper can be used as the contact material for a GaAs integrated circuit. Metallization of the wafer and through-wafer vias can be achieved through copper plating processes disclosed herein. To avoid warpage, the tensile stress of a conductive layer deposited onto a GaAs substrate can be offset by depositing a compensating layer having negative stress over the GaAs substrate. GaAs integrated circuits can be singulated, packaged, and incorporated into various electronic devices.
Public/Granted literature
- US20150115393A1 METHODS OF STRESS BALANCING IN GALLIUM ARSENIDE WAFER PROCESSING Public/Granted day:2015-04-30
Information query
IPC分类: