Invention Grant
- Patent Title: Image sensor defect identification using blurring techniques
- Patent Title (中): 使用模糊技术的图像传感器缺陷识别
-
Application No.: US14036939Application Date: 2013-09-25
-
Publication No.: US09232121B2Publication Date: 2016-01-05
- Inventor: Ilia Ovsiannikov
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N5/217 ; H04N5/367 ; H04N17/00

Abstract:
Embodiments described herein may operate to image a scene with an imaging system using an image blurring technique. An image sensor array (ISA) element may be identified as a dark defect element if a first ratio of an average of a set of illuminance signal magnitudes from a set of surrounding ISA elements to a magnitude of an illuminance signal from the ISA element is greater than a threshold sharpness value. The image sensor array element may be identified as a bright defect element if a second ratio of the magnitude of the illuminance signal from the ISA element to the average of the set of illuminance signal magnitudes from the set of surrounding ISA elements is greater than the threshold sharpness value.
Public/Granted literature
- US20140092279A1 IMAGE SENSOR DEFECT IDENTIFICATION USING BLURRING TECHNIQUES Public/Granted day:2014-04-03
Information query