Invention Grant
US09232214B2 Optical device for detection of optical defects for an imaging system
有权
用于检测成像系统的光学缺陷的光学装置
- Patent Title: Optical device for detection of optical defects for an imaging system
- Patent Title (中): 用于检测成像系统的光学缺陷的光学装置
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Application No.: US14151678Application Date: 2014-01-09
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Publication No.: US09232214B2Publication Date: 2016-01-05
- Inventor: Jean-Francois Blanc , Kamel Houairi , Stephane Garin , Marc Bernot , Arnaud Liotard , Christophe Devilliers
- Applicant: THALES
- Applicant Address: FR Courbevoie
- Assignee: THALES
- Current Assignee: THALES
- Current Assignee Address: FR Courbevoie
- Agency: Baker & Hostetler LLP
- Priority: FR1300047 20130111
- Main IPC: H04N17/02
- IPC: H04N17/02 ; H04N17/00 ; G01M11/00 ; G01M11/02 ; G02B7/00 ; G02B27/62

Abstract:
An optical monitoring device for an optical imaging system having a focal plane, an optical axis and an entry pupil, forming an image of a scene substantially at infinity on an image detector disposed substantially in the focal plane, comprises: a virtually point-like emission source at the periphery of the detector and substantially in the focal plane; a reflecting element with a plane surface upstream of the imaging system relative to the direction of light rays coming from the scene, and according to a position and inclination where a monitoring image of the source produced by the optical system and reflected by the reflecting element is substantially in the focal plane on a detection element connected to a monitoring image analyzer allowing potential optical defects to be identified; the reflecting element having an annular shape allowing passage of light rays coming from the scene and passing through the entry pupil.
Public/Granted literature
- US20140198222A1 OPTICAL MONITORING DEVICE FOR AN IMAGING SYSTEM Public/Granted day:2014-07-17
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