Invention Grant
- Patent Title: Management of storage of measurement data
- Patent Title (中): 管理测量数据的存储
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Application No.: US13642663Application Date: 2011-04-29
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Publication No.: US09232424B2Publication Date: 2016-01-05
- Inventor: Himke Van Der Velde , Gert Jan Van Lieshout , Kyeong In Jeong
- Applicant: Himke Van Der Velde , Gert Jan Van Lieshout , Kyeong In Jeong
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: GB1007293.2 20100430
- International Application: PCT/KR2011/003210 WO 20110429
- International Announcement: WO2011/136611 WO 20111103
- Main IPC: H04W24/00
- IPC: H04W24/00 ; H04W24/10 ; H04W24/08
Abstract:
A management of storage of measurement Data is provided. A method of managing storage of a set of measurement data comprises the steps of determining whether a value of at least one of said plurality of parameters has changed by more than a threshold amount from a value of the parameter in a previously stored set of measurement data and storing the set of measurement data, dependent upon the determination being affirmative.
Public/Granted literature
- US20130040659A1 MANAGEMENT OF STORAGE OF MEASUREMENT DATA Public/Granted day:2013-02-14
Information query
