Invention Grant
- Patent Title: Method and analysis system for eye examinations
- Patent Title (中): 眼科检查方法与分析系统
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Application No.: US14264217Application Date: 2014-04-29
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Publication No.: US09241627B2Publication Date: 2016-01-26
- Inventor: Andreas Steinmueller
- Applicant: Oculus Optikgeraete GmbH
- Applicant Address: DE Wetzlar
- Assignee: OCULUS OPTIKGERAETE GMBH
- Current Assignee: OCULUS OPTIKGERAETE GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Quarles & Brady LLP
- Priority: DE102013207987 20130430
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00 ; A61B3/107

Abstract:
An ophthalmological analysis system for examining an eye, in particular in the region of a front eye section of an eye includes first and second analysis systems obtaining sectional images of the eye. The first analysis system includes a projection device and a monitoring device arranged relative to each other according to the Scheimpflug rule. The second analysis system is an optical coherence interferometer. A processing device processes a first image data set obtained by the first analysis system and a second image data set obtained by the second analysis system to supplement the first image data set, at least partially, with data of the second image data set.
Public/Granted literature
- US20140320815A1 Method And Analysis System For Eye Examinations Public/Granted day:2014-10-30
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