Invention Grant
US09243883B2 Apparatus and method for conducting and real-time application of EC probe calibration
有权
用于进行和实时应用EC探针校准的设备和方法
- Patent Title: Apparatus and method for conducting and real-time application of EC probe calibration
- Patent Title (中): 用于进行和实时应用EC探针校准的设备和方法
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Application No.: US14227005Application Date: 2014-03-27
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Publication No.: US09243883B2Publication Date: 2016-01-26
- Inventor: Xiangdeng Xu , Paul DeAngelo
- Applicant: Olympus NDT, Inc.
- Applicant Address: US MA Waltham
- Assignee: OLYMPUS NDT, INC.
- Current Assignee: OLYMPUS NDT, INC.
- Current Assignee Address: US MA Waltham
- Agency: Ostrolenk Faber LLP
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01B7/06 ; G01N27/90

Abstract:
A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
Public/Granted literature
- US20150276371A1 APARATUS AND METHOD FOR CONDUCTING AND REAL-TIME APPLICATION OF EC PROBE CALIBRATION Public/Granted day:2015-10-01
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