Invention Grant
- Patent Title: Particle analytical device
- Patent Title (中): 粒子分析装置
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Application No.: US13767980Application Date: 2013-02-15
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Publication No.: US09243892B2Publication Date: 2016-01-26
- Inventor: Shigemi Tochino
- Applicant: HORIBA, Ltd.
- Applicant Address: JP
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2012-032161 20120216
- Main IPC: G01B7/12
- IPC: G01B7/12 ; G01B11/10 ; G01N15/02 ; G01N15/00

Abstract:
A particle analytical device comprises a light receiving part that receives the scattered light emitted from the particle group and that outputs an electric current signal, a data processing part that processes data based on time series data of a number of pulses obtained by the electric current signal, and a control part that halts a movement of the light receiving part in case that the overcurrent is detected based on the electric current signal and that restarts the movement of the light receiving part after a predetermined time passes and is characterized by that the data processing part holds the time series data until the light receiving part is halted and processes the data after the movement of the light receiving part is restarted by the use of the held time series data and the time series data obtained after the restart.
Public/Granted literature
- US20130218519A1 PARTICLE ANALYTICAL DEVICE Public/Granted day:2013-08-22
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