Invention Grant
- Patent Title: Three-dimensional measuring device and three-dimensional measuring system
- Patent Title (中): 三维测量装置和三维测量系统
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Application No.: US14050414Application Date: 2013-10-10
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Publication No.: US09243897B2Publication Date: 2016-01-26
- Inventor: Kaoru Kumagai , Takahiro Inoue , Ken-ichiro Yoshino
- Applicant: Kabushiki Kaisha TOPCON
- Applicant Address: JP Tokyo-to
- Assignee: Kabushiki Kaisha TOPCON
- Current Assignee: Kabushiki Kaisha TOPCON
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2012-231949 20121019
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01C1/04 ; G01C15/00

Abstract:
A three-dimensional measuring device includes a light source unit, a light projecting optical unit, a light receiving optical unit, a light receiving element, a scanning unit, an angle detector, an illumination light source unit, an image pickup unit and a control arithmetic unit. The control arithmetic unit comprises a distance data processing unit for controlling the scanning unit, for calculating a distance to the object to be measured based on a received light signal, and for calculating a three-dimensional data of the object based on a calculated distance and a detection signal from the angle detector, and an image data processing unit for acquiring an illuminated image and an unilluminated image, for acquiring a difference image based on both images, for detecting a retroreflective target based on the difference image and a detected intensity of a reflected light from the difference image, and for calculating a position of the target.
Public/Granted literature
- US20140111618A1 Three-Dimensional Measuring Device and Three-Dimensional Measuring System Public/Granted day:2014-04-24
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