Invention Grant
- Patent Title: Analyte test strip and analyte meter device
- Patent Title (中): 分析物试片和分析仪表装置
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Application No.: US13808736Application Date: 2011-06-30
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Publication No.: US09244000B2Publication Date: 2016-01-26
- Inventor: Sridhar Iyengar , Ian Harding , Charles Boiteau , Collin Butters
- Applicant: Sridhar Iyengar , Ian Harding , Charles Boiteau , Collin Butters
- Applicant Address: US NH Salem
- Assignee: AgaMatrix, Inc.
- Current Assignee: AgaMatrix, Inc.
- Current Assignee Address: US NH Salem
- Agency: Larson & Anderson, LLC
- International Application: PCT/US2011/042572 WO 20110630
- International Announcement: WO2012/006210 WO 20120112
- Main IPC: G01N27/327
- IPC: G01N27/327 ; G01N21/25 ; G01N21/77 ; G01N21/84 ; G01N33/487

Abstract:
A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.
Public/Granted literature
- US20130146478A1 Analyte Test Strip and Analyte Meter Device Public/Granted day:2013-06-13
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