Invention Grant
US09244027B2 Method and instrument for identifying jewelry with plated element using x-ray florescence
有权
使用X射线荧光鉴定具有电镀元件的首饰的方法和仪器
- Patent Title: Method and instrument for identifying jewelry with plated element using x-ray florescence
- Patent Title (中): 使用X射线荧光鉴定具有电镀元件的首饰的方法和仪器
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Application No.: US13906641Application Date: 2013-05-31
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Publication No.: US09244027B2Publication Date: 2016-01-26
- Inventor: Brendan Connors
- Applicant: Brendan Connors
- Applicant Address: US MA Waltham
- Assignee: OLYMPUS NDT
- Current Assignee: OLYMPUS NDT
- Current Assignee Address: US MA Waltham
- Agency: Ostrolenk Faber LLP
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.
Public/Granted literature
- US20130322595A1 METHOD AND INSTRUMENT FOR IDENTIFYING JEWELRY WITH PLATED ELEMENT USING X-RAY FLORESCENCE Public/Granted day:2013-12-05
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