Invention Grant
US09244027B2 Method and instrument for identifying jewelry with plated element using x-ray florescence 有权
使用X射线荧光鉴定具有电镀元件的首饰的方法和仪器

  • Patent Title: Method and instrument for identifying jewelry with plated element using x-ray florescence
  • Patent Title (中): 使用X射线荧光鉴定具有电镀元件的首饰的方法和仪器
  • Application No.: US13906641
    Application Date: 2013-05-31
  • Publication No.: US09244027B2
    Publication Date: 2016-01-26
  • Inventor: Brendan Connors
  • Applicant: Brendan Connors
  • Applicant Address: US MA Waltham
  • Assignee: OLYMPUS NDT
  • Current Assignee: OLYMPUS NDT
  • Current Assignee Address: US MA Waltham
  • Agency: Ostrolenk Faber LLP
  • Main IPC: G01N23/223
  • IPC: G01N23/223
Method and instrument for identifying jewelry with plated element using x-ray florescence
Abstract:
The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.
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