Invention Grant
US09244086B2 Sample analyzing system, sample analyzer, and management method of sample analyzing system
有权
样品分析系统，样品分析仪和样品分析系统的管理方法
- Patent Title: Sample analyzing system, sample analyzer, and management method of sample analyzing system
- Patent Title (中): 样品分析系统，样品分析仪和样品分析系统的管理方法
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Application No.: US13851677Application Date: 2013-03-27
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Publication No.: US09244086B2Publication Date: 2016-01-26
- Inventor: Syunsuke Yao , Shiro Kuwaoka , Taisuke Nishida
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-073882 20120328
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N35/00 ; G01N33/00
Abstract:
A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control unit for controlling the second measurement unit; wherein the first control unit is configured to transmit an activation signal for activating the second sample analyzer when a predetermined condition is met for the first sample analyzer; and the second control unit is configured to activate the second sample analyzer when the activation signal is received.
Public/Granted literature
- US20130260414A1 SAMPLE ANALYZING SYSTEM, SAMPLE ANALYZER, AND MANAGEMENT METHOD OF SAMPLE ANALYZING SYSTEM Public/Granted day:2013-10-03
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