Invention Grant
- Patent Title: Method of determining performance of a chip of an integrated-circuit design and an apparatus and an integrated circuit using the same
- Patent Title (中): 确定集成电路设计的芯片的性能的方法以及使用其的装置和集成电路
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Application No.: US13959764Application Date: 2013-08-06
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Publication No.: US09244122B2Publication Date: 2016-01-26
- Inventor: Shi-Hao Chen , Yung-Sheng Fang , Szu-Pang Mu , Mango Chia-Tso Chao
- Applicant: Shi-Hao Chen , Yung-Sheng Fang , Szu-Pang Mu , Mango Chia-Tso Chao
- Applicant Address: TW Hsinchu TW Hsinchu
- Assignee: Global Unichip Corp.,Taiwan Semiconductor Manufacturing Company Ltd.
- Current Assignee: Global Unichip Corp.,Taiwan Semiconductor Manufacturing Company Ltd.
- Current Assignee Address: TW Hsinchu TW Hsinchu
- Agency: Litron Patents & Trademark Office
- Agent Min-Lee Teng
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/317

Abstract:
A method of determining the performance of a chip of an integrated-circuit design comprises instantiating a plurality of HPM in the integrated-circuit design to generate the performance of the chip according to a performance function defined by a polynomial comprising a plurality of terms, wherein each term of the polynomial comprises an exponent of a value generated by a corresponding one of the plurality of HPM(s) and a corresponding coefficient, wherein the coefficients are determined through a regression process with sample chips of the integrated-circuit design having known performance, so that the performance of each chip other than the sample chips can be determined by the performance function and the values of the plurality of HPM(s) of the chip.
Public/Granted literature
- US20150042369A1 METHOD AND AN APPARATUS OF DETERMINING PERFORMANCE OF AN INTEGRATED CIRCUIT Public/Granted day:2015-02-12
Information query
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