Invention Grant
US09244349B2 Positive resist composition and method of forming resist pattern
有权
正型抗蚀剂组合物和形成抗蚀剂图案的方法
- Patent Title: Positive resist composition and method of forming resist pattern
- Patent Title (中): 正型抗蚀剂组合物和形成抗蚀剂图案的方法
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Application No.: US12789152Application Date: 2010-05-27
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Publication No.: US09244349B2Publication Date: 2016-01-26
- Inventor: Takayoshi Mori , Toshiaki Hato
- Applicant: Takayoshi Mori , Toshiaki Hato
- Applicant Address: JP Kawasaki-Shi
- Assignee: TOKYO OHKA KOGYO CO., LTD.
- Current Assignee: TOKYO OHKA KOGYO CO., LTD.
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: JPP2009-132311 20090601
- Main IPC: G03F7/004
- IPC: G03F7/004 ; G03F7/039 ; G03F7/20

Abstract:
A positive resist composition including a base component, an acid-generator component and a fluorine-containing polymer component (F) in a specific amount, the fluorine-containing polymer component (F) including a fluorine-containing polymer (F1) consisting of a structural unit (F-1) represented by general formula (F-1) (RC represents a hydrogen atom or a methyl group, R1 and R2 represent a hydrogen atom, an alkyl group or a fluorinated alkyl group, R3 represents a fluorine atom or a fluorinated alkyl group, and R4 represents an alkyl group or a fluorinated alkyl group) or a fluorine-containing copolymer (F2) containing the structural unit (F-1) and at least one structural unit selected from the group consisting of a structural unit (F-2) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group and a structural unit (F-3) represented by general formula (F-3) (RC represents a hydrogen atom or a methyl group, Z represents a single bond or a divalent linking group, and r represents an integer of 0 to 2).
Public/Granted literature
- US20100310985A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN Public/Granted day:2010-12-09
Information query
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