Invention Grant
- Patent Title: Parallelization of error analysis circuitry for reduced power consumption
- Patent Title (中): 并行化误差分析电路,降低功耗
-
Application No.: US13340286Application Date: 2011-12-29
-
Publication No.: US09244765B2Publication Date: 2016-01-26
- Inventor: Itai Dror
- Applicant: Itai Dror
- Applicant Address: IL Kfar Saba
- Assignee: SanDisk IL Ltd.
- Current Assignee: SanDisk IL Ltd.
- Current Assignee Address: IL Kfar Saba
- Agency: Brinks Gilson & Lione
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; H03M13/15 ; H03M13/37 ; H03M13/00

Abstract:
A memory device (e.g., a flash memory device) includes power efficient codeword error analysis circuitry. The circuitry analyzes codewords stored in the memory of the memory device to locate and correct errors in the codewords before the codewords are communicated to a host device that requests the codewords from the memory device. The circuitry includes a highly parallel configuration with reduced complexity (e.g., reduced gate count) that a controller may cause to perform the error analysis under most circumstances. The circuitry also includes an analysis section of greater complexity with a less parallel configuration that the controller may cause to perform the error analysis less frequently. Because the more complex analysis section runs less frequently, the error analysis circuitry may provide significant power consumption savings in comparison to prior designs for error analysis circuitry.
Public/Granted literature
- US20120246526A1 Parallelization of Error Analysis Circuitry for Reduced Power Consumption Public/Granted day:2012-09-27
Information query