Invention Grant
- Patent Title: Data metric resolution prediction system and method
- Patent Title (中): 数据度量分辨率预测系统及方法
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Application No.: US14014707Application Date: 2013-08-30
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Publication No.: US09245248B2Publication Date: 2016-01-26
- Inventor: Oren Tibi Solomon , Israel Kalush
- Applicant: Dell Software Inc.
- Applicant Address: US CA Aliso Viejo
- Assignee: Dell Software Inc.
- Current Assignee: Dell Software Inc.
- Current Assignee Address: US CA Aliso Viejo
- Agency: Winstead PC
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06N5/02 ; G06Q10/06

Abstract:
In one embodiment, a method includes receiving an identity of a metric of interest and a future time point. The method further includes retrieving a prediction configuration previously associated with the metric of interest. The prediction configuration comprising a period combination. The period combination comprises a plurality of time periods, each time period comprises one or more segments, and each segment of the one or more segments comprises adapted historical values of the metric of interest incrementally inserted therein. The method also includes, for each time period of the plurality of time periods, identifying, for the future time point, a corresponding segment of the one or more segments, accessing a set of adapted historical values from the corresponding segment, and computing an intermediate predicted value from the set of adapted historical values. Moreover, the method includes calculating a predicted value for the metric of interest based on the computing.
Public/Granted literature
- US20140095422A1 DATA METRIC RESOLUTION PREDICTION SYSTEM AND METHOD Public/Granted day:2014-04-03
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