Invention Grant
- Patent Title: Read measurement of resistive memory cells
- Patent Title (中): 读取电阻式存储单元的测量
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Application No.: US13925202Application Date: 2013-06-24
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Publication No.: US09245618B2Publication Date: 2016-01-26
- Inventor: Nikolaos Papandreou , Charalampos Pozidis , Abu Sebastian
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Priority: GB1209594.9 20120530
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/56

Abstract:
A method for read measurement of resistive memory cells having s≧2 programmable cell-states includes applying to each cell at least one initial voltage and making a measurement indicative of cell current due to the initial voltage; determining a read voltage for the cell in dependence on the measurement; applying the read voltage to the cell; making a read measurement indicative of cell current due to the read voltage; and outputting a cell-state metric dependent on the read measurement; wherein the read voltages for cells are determined in such a manner that the cell-state metric exhibits a desired property.
Public/Granted literature
- US20130322157A1 READ MEASUREMENT OF RESISTIVE MEMORY CELLS Public/Granted day:2013-12-05
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