Invention Grant
US09245651B2 Memory device for masking read data and a method of testing the same
有权
用于掩蔽读取数据的存储器件及其测试方法
- Patent Title: Memory device for masking read data and a method of testing the same
- Patent Title (中): 用于掩蔽读取数据的存储器件及其测试方法
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Application No.: US14330424Application Date: 2014-07-14
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Publication No.: US09245651B2Publication Date: 2016-01-26
- Inventor: Jeong Yun Cha , Yun Kil Kim , Jeong Hwa Jeong
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2013-0083004 20130715
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/12 ; G11C7/10 ; G11C11/4096 ; G11C29/26

Abstract:
A memory device includes a memory array, a plurality of input/output pins, a mask signal generator, an input/output block. The memory array is configured to output read data including a plurality of data bits. The mask signal generator is configured to generate at least one data mask signal. The input/output block is configured to mask bits having a logic level among the plurality of data bits in the read data to output the masked read data to the plurality of input/output pins.
Public/Granted literature
- US20150016200A1 MEMORY DEVICE FOR MASKING READ DATA AND A METHOD OF TESTING THE SAME Public/Granted day:2015-01-15
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