Invention Grant
- Patent Title: Built in self-test
- Patent Title (中): 内置自检
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Application No.: US14481636Application Date: 2014-09-09
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Publication No.: US09246503B1Publication Date: 2016-01-26
- Inventor: David Hamilton , Tom Clayton , Gordon Sharp , Ian Stevenson
- Applicant: Ateeda Limited
- Applicant Address: GB Edinburg
- Assignee: ATEEDA LTD.
- Current Assignee: ATEEDA LTD.
- Current Assignee Address: GB Edinburg
- Agency: Alston & Bird LLP
- Main IPC: H03M1/06
- IPC: H03M1/06 ; H03M1/10 ; H03M1/66
Abstract:
A method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of the fixed voltage segments to assess or determine performance of the DAC.
Information query
