Invention Grant
- Patent Title: Testing apparatus and test display method
- Patent Title (中): 测试仪器和测试显示方法
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Application No.: US14138477Application Date: 2013-12-23
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Publication No.: US09246789B2Publication Date: 2016-01-26
- Inventor: Junya Tanaka , Yasuyuki Matsuyama , Takuma Goto
- Applicant: Junya Tanaka , Yasuyuki Matsuyama , Takuma Goto
- Applicant Address: JP Atsugi-shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-shi
- Agency: Greer Burns & Crain Ltd.
- Priority: JP2013-012199 20130125
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H04L12/26 ; H04W24/06

Abstract:
A testing apparatus includes a scenario processing unit that executes a test scenario for operating the testing apparatus to imitate the operation of a base station, a communication unit capable of transmitting and receiving a message to and from a mobile communication terminal, a layer processing unit for processing a message for each layer, a log data storing unit for storing log data indicating transmission of messages between the layers, and a display controller for creating a transmission schedule based on the extracted data associated with system information and causing a display unit to display the transmission schedule. The transmission schedule is written in a tabular form in which a block type of the system information is displayed at a position to which a frame for transmitting the system information is allocated.
Public/Granted literature
- US20140215281A1 TESTING APPARATUS AND TEST DISPLAY METHOD Public/Granted day:2014-07-31
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