Invention Grant
- Patent Title: Light emitting module testing apparatus
- Patent Title (中): 发光模块测试仪
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Application No.: US14334337Application Date: 2014-07-17
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Publication No.: US09247626B2Publication Date: 2016-01-26
- Inventor: Sun Ki Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2013-0123371 20131016
- Main IPC: H05B37/03
- IPC: H05B37/03 ; G01J1/08 ; G01J1/42 ; H05B33/08

Abstract:
A light emitting module testing apparatus includes a sensing unit and a controller. The sensing unit includes a photodiode array sensing light emitted from a light emitting module serving as a test object. The controller generates luminance information based on light sensed by the sensing unit, and sets an operating condition of the light emitting module serving as the test object by comparing the generated luminance information with a pre-set reference range. The light emitting module testing apparatus thereby senses luminance of light emitted from the light emitting module serving as a test object, and sets the operating condition of the light emitting module to have an appropriate luminance.
Public/Granted literature
- US20150102728A1 LIGHT EMITTING MODULE TESTING APPARATUS Public/Granted day:2015-04-16
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