Invention Grant
- Patent Title: CMM with flaw detection system
- Patent Title (中): CMM具有探伤系统
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Application No.: US13797537Application Date: 2013-03-12
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Publication No.: US09250214B2Publication Date: 2016-02-02
- Inventor: Paul Ferrari , Hyun Kwon Jung , Hogar Tait
- Applicant: Hexagon Metrology, Inc.
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G01N29/265
- IPC: G01N29/265 ; G01B21/04 ; G01N29/04 ; G01N29/22
Abstract:
A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.
Public/Granted literature
- US20140260627A1 CMM WITH FLAW DETECTION SYSTEM Public/Granted day:2014-09-18
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